IEEE 1801-2009 小功率集成电路的设计和检验

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【英文标准名称】:Designandverificationoflowpowerintegratedcircuits
【原文标准名称】:小功率集成电路的设计和检验
【标准号】:IEEE1801-2009
【标准状态】:现行
【国别】:美国
【发布日期】:2009
【实施或试行日期】:
【发布单位】:美国电气电子工程师学会(US-IEEE)
【起草单位】:IEEE
【标准类型】:()
【标准水平】:()
【中文主题词】:指令结构;命令;计算机硬件;数据处理;定义;设计;数字的;电气工程;电子工程;电子系统;硬件;集成电路;程序设计语言;句法
【英文主题词】:Commandstructure;Commands;Computerhardware;Dataprocessing;Definitions;Design;Digital;Electricalengineering;Electronicengineering;Electronicsystems;Hardware;Integratedcircuits;Programminglanguages;Syntax
【摘要】:Thisstandardestablishesaformatusedtodefinethelowpowerdesignintentforelectronicsystemsandelectronicintellectualproperty.Theformatprovidestheabilitytospecifythesupplynetwork,switches,isolation,retentionandotheraspectsrelevanttopowermanagementofanelectronicsystem.Thestandarddefinestherelationshipbetweenthelowpowerdesignspecificationandthelogicdesignspecificationcapturedviaotherformats(e.g.,standardhardwaredescriptionlanguages).Thestandardprovidesportabilityoflowpowerdesignspecificationsthatcanbeusedwithavarietyofcommercialproductsthroughoutanelectronicsystemdesign,analysis,verificationandimplementationflow.
【中国标准分类号】:L55
【国际标准分类号】:31_200
【页数】:234P;A4
【正文语种】:英语


MIL-R-21248B, MILITARY SPECIFICATION: RING, RETAINING (TAPERED AND REDUCED SECTION TYPE) (02 AUG 1969)., This specification covers the procurement requirements for tapered and reduced section type retaining rings of rectangular and beveled cross-section.MIL-STD-750D (NOTICE 4), DEPARTMENT OF DEFENSE: TEST METHOD STANDARD FOR SEMICONDUCTOR DEVICES (30 APR 2001)., To all holders of MIL-STD-750D: 1. The following pages of MIL-STD-750D have been revised and supersede the pages listed: